Recombination lifetime measurements in silicon / 
edited by Dinesh C. Gupta, Fred R. Bacher and William M. Hughes 
 - West Conshohocken, PA :  ASTM,  c1998. 
 - 392 p. :  ill. ;  24 cm. 
<br/><br/> Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.  "STP 1340." 
<br/><br/>Includes bibliographical references and indexes. 
<br/><br/>
<br/><br/><label>ISBN: </label>0803124899 
<br/><br/><label>LCCN: </label>98022034  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Testing--Congresses.<br/>Service life (Engineering)--Forecasting--Congresses.<br/>Electronic measurements--Congresses.
<br/><br/><label>Dewey Class. No.: </label>621.38152